Signal-to-noise ratio of electron micrographs obtained by cross correlation-Reference-Cited by-同舟云学术

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Signal-to-noise ratio of electron micrographs obtained by cross correlation

Published:1975-07 Issue:5516 Volume:256 Page:376-379
ISSN:0028-0836
Container-title:Nature
language:en
Short-container-title:Nature

Author:

Frank J.,Al-Ali L.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/256376a0.pdf

Reference18 articles.

1. Bershad, N. J., and Rockmore, A. J., IEEE Trans., IT, 20, 112–113 (1974).

2. Lenz, F., in Electron Microcopy in Material Science, (edit. by Valdre, U.), (Academic, London, 1971).

3. cf. Hanszen, K.-J., Adv. opt. Elect. Micr. 4, 1–84 (1971).

4. Hanszen, K.-J., and Trepte, L., Optik, 32, 519–538 (1971).

5. Hanszen, K.-J., and Trepte, L., Optik, 33, 182–198 (1971).

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