Advanced spectroscopic techniques for characterizing defects in perovskite solar cells

Author:

Srivastava SaurabhORCID,Ranjan Sudhir,Yadav Lokesh,Sharma Tejasvini,Choudhary Shivani,Agarwal Daksh,Singh Anand,Satapathi Soumitra,Gupta Raju Kumar,Garg Ashish,Nalwa Kanwar S.

Abstract

AbstractThere is currently substantial interest in commercializing perovskite solar cells as they offer superior properties over silicon-based solar cells, such as ability for bandgap tuning, higher absorption coefficients, and potentially lower manufacturing costs. However, trap states originating from ionic vacancies, imperfect interfaces, and grain boundaries have hampered their performance and long-term stability during operation. Identifying and quantifying defects in perovskite solar cells becomes inevitable to address these challenges and mitigate the deteriorating effects of these defects. This Review focuses on recent developments in optical and electrical characterization techniques employed for the investigation of defects in halide perovskites and the techniques to understand ion migration in devices. We focus on sample preparation, advantages, limitations, and the nature of information obtained from each of the spectroscopic techniques. This Review will enable the researchers to understand and identify suitable characterization techniques for characterizing defect concentrations and their energetic and spatial distribution in perovskite solar cells.

Funder

DST | Science and Engineering Research Board

Department of Science and Technology, Ministry of Science and Technology

Publisher

Springer Science and Business Media LLC

Subject

Mechanics of Materials,General Materials Science

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3