Ptychography at the carbon K-edge

Abstract

AbstractPtychography is a coherent diffraction imaging technique that measures diffraction patterns at many overlapping points on a sample and then uses an algorithm to reconstruct amplitude and phase images of the object and probe. Here, we report imaging, spectroscopy and linear dichroism ptychographic measurements at the carbon K-edge. This progress was achieved with a new generation of scientific Complementary Metal Oxide Semiconductor (sCMOS) X-ray cameras with an uncoated image sensor which has fast image transfer and high quantum efficiency at the carbon K-edge. Reconstructed amplitude and phase contrast images, C 1s spectral stacks, and X-ray linear dichroism of carbon nanotubes at the carbon K-edge were measured with ptychography. Ptychography and conventional Scanning Transmission X-ray Microscopy (STXM) are compared using results acquired from the same area. Relative to STXM, ptychography provides both improved spatial resolution and improved image quality. We used defocus ptychography, with an X-ray beam spot size of 1.0 micron, in order to reduce radiation damage and carbon deposition. Comparable spatial resolution was achieved to that of ptychography performed with a focused beam. Ptychography at the carbon K-edge offers unique opportunities to perform high resolution spectromicroscopy on organic materials important in medicine, biology, environmental science and energy materials.