A Pixelated Microwave Near-Field Sensor for Precise Characterization of Dielectric Materials

Abstract

Abstract A highly sensitive microwave near-field sensor based on electrically-small planar resonators is proposed for highly accurate characterization of dielectric materials. The proposed sensor was developed in a robust complete-cycle topology optimization procedure wherein first the sensing area was pixelated. By maximizing the sensitivity as our goal, a binary particle swarm optimization algorithm was applied to determine whether each pixel is metalized or not. The outcome of the optimization is a pixelated pattern of the resonator yielding the maximum possible sensitivity. A curve fitting method was applied to the full-wave simulation results to derive a closed form expression for extracting the dielectric constant of a chemical material from the shift in the resonance frequency of the sensor. As a proof of concept, the sensor was fabricated and used to measure the permittivity of two known liquids (cyclohexane and chloroform) and their mixtures with different volume ratios. The experimentally extracted dielectric constants were in an excellent agreement with the reference data (for pure cyclohexane and chloroform) or those obtained by mixture formulas.