Author:
Nakafuji Keiichiro,Koyama Motomichi,Tsuzaki Kaneaki
Abstract
AbstractElastoplastic phenomena, such as plastic deformation and failure, are multi-scale, deformation-path-dependent, and mechanical-field-sensitive problems associated with metals. Accordingly, visualization of the microstructural deformation path under a specific mechanical field is challenging for the elucidation of elastoplastic phenomena mechanisms. To overcome this problem, a dislocation-resolved in-situ technique for deformation under mechanically controllable conditions is required. Thus, we attempted to apply electron channeling contrast imaging (ECCI) under tensile loading, which enabled the detection of lattice defect motions and the evolution of elastic strain fields in bulk specimens. Here, we presented the suitability of ECCI as an in-situ technique with dislocation-detectable spatial resolution. In particular, the following ECCI-visualized plasticity-related phenomena were observed: (1) pre-deformation-induced residual stress and its disappearance via subsequent reloading, (2) heterogeneous dislocation motion during plastic relaxation, and (3) planar surface relief formation via loading to a higher stress.
Publisher
Springer Science and Business Media LLC
Reference29 articles.
1. Tanaka, M. & Higashida, K. High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals. Mater. Sci. Eng. A 400–401, 426–430 (2005).
2. Tanaka, M. et al. Sequential multiplication of dislocation sources along a crack front revealed by high-voltage electron microscopy and tomography. J. Mater. Res. 26, 508–513 (2011).
3. Kondo, S., Mitsuma, T., Shibata, N. & Ikuhara, Y. Direct observation of individual dislocation interaction processes with grain boundaries. Sci. Adv. 2, e1501926 (2016).
4. Ito, K., Inui, H., Shirai, Y. & Yamaguchi, M. Plastic deformation of MoSi2 single crystals. Philos. Mag. A Phys. Condens. Matter, Struct. Defects Mech. Prop. 72, 1075–1097 (1995).
5. Dunlap, B. E., Ruggles, T. J., Fullwood, D. T., Jackson, B. & Crimp, M. A. Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction. Ultramicroscopy 184, 125–133 (2018).
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献