Author:
Dad Sania,Dziawa Piotr,Zajkowska-Pietrzak Wiktoria,Kret Sławomir,Kozłowski Mirosław,Wójcik Maciej,Sadowski Janusz
Abstract
AbstractWe investigate the full and half-shells of Pb1−xSnxTe topological crystalline insulator deposited by molecular beam epitaxy on the sidewalls of wurtzite GaAs nanowires (NWs). Due to the distinct orientation of the IV–VI shell with respect to the III–V core the lattice mismatch between both materials along the nanowire axis is less than 4%. The Pb1−xSnxTe solid solution is chosen due to the topological crystalline insulator properties above some critical concentrations of Sn (x ≥ 0.36). The IV–VI shells are grown with different compositions spanning from binary SnTe, through Pb1−xSnxTe with decreasing x value down to binary PbTe (x = 0). The samples are analysed by scanning transmission electron microscopy, which reveals the presence of (110) or (100) oriented binary PbTe and (100) Pb1−xSnxTe on the sidewalls of wurtzite GaAs NWs.
Publisher
Springer Science and Business Media LLC
Cited by
3 articles.
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