Author:
Dai Huafeng,Wang Jyunrong,Zhong Quan,Chen Taogen,Liu Hao,Zhang Xuegang,Lu Rongsheng
Abstract
AbstractIn numerous applications, abnormal samples are hard to collect, limiting the use of well-established supervised learning methods. GAN-based models which trained in an unsupervised and single feature set manner have been proposed by simultaneously considering the reconstruction error and the latent space deviation between normal samples and abnormal samples. However, the ability to capture the input distribution of each feature set is limited. Hence, we propose an unsupervised and multi-feature model, Wave-GANomaly, trained only on normal samples to learn the distribution of these normal samples. The model predicts whether a given sample is normal or not by its deviation from the distribution of normal samples. Wave-GANomaly fuses and selects from the wave-based features extracted by the WaveBlock module and the convolution-based features. The WaveBlock has proven to efficiently improve the performance on image classification, object detection, and segmentation tasks. As a result, Wave-GANomaly achieves the best average area under the curve (AUC) on the Canadian Institute for Advanced Research (CIFAR)-10 dataset (94.3%) and on the Modified National Institute of Standards and Technology (MNIST) dataset (91.0%) when compared to existing state-of-the-art anomaly detectors such as GANomaly, Skip-GANomaly, and the skip-attention generative adversarial network (SAGAN). We further verify our method by the self-curated real-world dataset, the result show that our method is better than GANomaly which only use single feature set for training the model.
Funder
An Accurate Defect Detection System for Electronic Manufacturing Products
Publisher
Springer Science and Business Media LLC
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