Determination on the Coefficient of Thermal Expansion in High-Power InGaN-based Light-emitting Diodes by Optical Coherence Tomography-Reference-Cited by-同舟云学术

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Determination on the Coefficient of Thermal Expansion in High-Power InGaN-based Light-emitting Diodes by Optical Coherence Tomography

Published:2017-10-31 Issue:1 Volume:7 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Lee Ya-Ju,Chou Chun-Yang,Huang Chun-Ying,Yao Yung-Chi,Haung Yi-Kai,Tsai Meng-Tsan

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41598-017-14689-y.pdf

Reference42 articles.

1. Piper, W. W. et al. Theory of electroluminescence. Phys. Rev. 98, 1809–1813 (1955).

2. Mead, C. Electron transport mechanisms in thin insulating films. Phys. Rev. 128, 2088–2093 (1962).

3. Park, W. Y. et al. Efficiency improvement opportunities in TVs: Implications for market transformation programs. Energy Policy 59, 361–372 (2013).

4. Lee, Y. J. et al. Effect of Surface Texture and Backside Patterned Reflector on the AlGaInP Light-Emitting Diode: High Extraction of Waveguided Light. IEEE J. Quant. Electron. 4, 636–641 (2011).

5. Chen, P. C. et al. Color separation system with angularly positioned light source module for pixelized backlighting. Opt. Express 18, 645–655 (2010).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical Coherence Tomography for NDE;Handbook of Advanced Nondestructive Evaluation;2019

2. Optical Coherence Tomography for NDE;Handbook of Advanced Non-Destructive Evaluation;2018

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