Author:
Abe Masayuki,Toki Hiroshi
Funder
Ministry of Education, Culture, Sports, Science and Technology
Publisher
Springer Science and Business Media LLC
Reference26 articles.
1. Ramdani, M. et al. The Electromagnetic Compatibility of Integrated Circuits - Past, Present, and Future. IEEE Trans. Electromagn. Compat. 51, 78–100 (2009).
2. Olsen, R. G. Radio noise due to corona on a multiconductor power line above a dissipative earth. IEEE Trans. Power Del. 3, 272–287 (1988).
3. Gharpurey, R. & Meyer, R. G. Modeling and Analysis of Substrate Coupling in Integrated Circuits. IEEE J. Solid-State Circuits 31, 344–353 (1996).
4. Fiori, F. Prediction of RF interference effects in smart power integrated circuits, IEEE International Symposium on Electromagnetic Compatibility 345–347 (2000).
5. Vaidyanath, A., Thoroddsen, B., Prince, J. L. & Cangellaris, A. C. Simultaneous Swithching Noise: Influence of Plane-Plane and Plane-Signal Trace Coupling. IEEE Trans. Compon. Packag. Manuf. Technol. 18, 496–502 (1995).
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