Author:
Zwiebler M.,Di Gennaro E.,Hamann-Borrero J. E.,Ritschel T.,Green R. J.,Sawatzky G. A.,Schierle E.,Weschke E.,Leo A.,Granozio F. Miletto,Geck J.
Abstract
AbstractWe present a combined resonant soft X-ray reflectivity and electric transport study of $$\hbox {LaAlO}_3$$
LaAlO
3
/$$\hbox {SrTiO}_3$$
SrTiO
3
field effect devices. The depth profiles with atomic layer resolution that are obtained from the resonant reflectivity reveal a pronounced temperature dependence of the two-dimensional electron liquid at the $$\hbox {LaAlO}_3$$
LaAlO
3
/$$\hbox {SrTiO}_3$$
SrTiO
3
interface. At room temperature the corresponding electrons are located close to the interface, extending down to 4 unit cells into the $$\hbox {SrTiO}_3$$
SrTiO
3
substrate. Upon cooling, however, these interface electrons assume a bimodal depth distribution: They spread out deeper into the $$\hbox {SrTiO}_3$$
SrTiO
3
and split into two distinct parts, namely one close to the interface with a thickness of about 4 unit cells and another centered around 9 unit cells from the interface. The results are consistent with theoretical predictions based on oxygen vacancies at the surface of the $$\hbox {LaAlO}_3$$
LaAlO
3
film and support the notion of a complex interplay between structural and electronic degrees of freedom.
Funder
Deutsche Forschungsgemeinschaft
Projekt DEAL
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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