Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements-Reference-Cited by-同舟云学术

Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

Published:2019-06-04 Issue:1 Volume:9 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Stelzer Bastian^ORCID,Chen Xiang^ORCID,Bliem Pascal,Hans Marcus^ORCID,Völker Bernhard,Sahu Rajib,Scheu Christina^ORCID,Primetzhofer Daniel,Schneider Jochen M.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41598-019-44692-4.pdf

Reference36 articles.

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2. Barsoum, M. W. MAX Phases Properties of Machinable Ternary Carbides and Nitrides. (Wiley-VCH, 2013).

3. Barsoum, M. W. The MN + 1AXN phases: A new class of solids: Thermodynamically stable nanolaminates. Progress in Solid State Chemistry 28, 201–281, https://doi.org/10.1016/S0079-6786(00)00006-6 (2000).

4. Baben, M., Shang, L., Emmerlich, J. & Schneider, J. M. Oxygen incorporation in M2AlC (M = Ti, V, Cr). Acta Materialia 60, 4810–4818, https://doi.org/10.1016/j.actamat.2012.05.011 (2012).

5. Hettinger, J. D. et al. Electrical transport, thermal transport, and elastic properties of M2AlC (M = Ti, Cr, Nb, and V). Physical Review B 72, https://doi.org/10.1103/PhysRevB.72.115120 (2005).

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