Author:
Walls B.,Mazilkin A. A.,Mukhamedov B. O.,Ionov A.,Smirnova I. A.,Ponomareva A. V.,Fleischer K.,Kozlovskaya N. A.,Shulyatev D. A.,Abrikosov I. A.,Shvets I. V.,Bozhko S. I.
Abstract
AbstractIn this work we present a comprehensive study of the domain structure of a nickel oxide single crystal grown by floating zone melting and suggest a correlation between point defects and the observed domain structure. The properties and structure of domains dictate the dynamics of resistive switching, water splitting and gas sensing, to name but a few. Investigating the correlation between point defects and domain structure can provide a deeper understanding of their formation and structure, which potentially allows one to tailor domain structure and the dynamics of the aforementioned applications. A range of inhomogeneities are observed by diffraction and microscopy techniques. X-ray and low-energy electron diffraction reveal domains on the submicron- and nanometer-scales, respectively. In turn, these domains are visualised by atomic force and scanning tunneling microscopy (STM), respectively. A comprehensive transmission electron microscopy (TEM) study reveals inhomogeneities ranging from domains of varying size, misorientation of domains, variation of the lattice constant and bending of lattice planes. X-ray photoelectron spectroscopy and electron energy-loss spectroscopy indicate the crystal is Ni deficient. Density functional theory calculations—considering the spatial and electronic disturbance induced by the favourable nickel vacancy—reveal a nanoscale distortion comparable to STM and TEM observations. The different inhomogeneities are understood in terms of the structural relaxation induced by ordering of nickel vacancies, which is predicted to be favourable.
Funder
Erasmus
Irish Research Council
Russian Foundation for Basic Research
Ministry of Science and Higher Education of the Russian Federation
Russian Science Foundation
Vetenskapsrådet
Swedish Government Strategic Research Areas in Materials Science on Functional Materials
Publisher
Springer Science and Business Media LLC
Cited by
15 articles.
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