Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-017-04803-5.pdf
Reference38 articles.
1. Oesterschulze, E., Stopka, M., Ackermann, L., Scholz, W. & Werner, S. Thermal imaging of thin films by scanning thermal microscope. J. Vac. Sci. Technol. B 14, 832–837 (1996).
2. Huang, M. et al. Room-temperature ultraviolet nanowire nanolasers. Science 292, 1897–9 (2001).
3. Zheng, X., Cahill, D. G., Weaver, R. & Zhao, C. J. Micron-scale measurements of the coefficient of thermal expansion by time-domain probe beam deflection. Journal of Applied Physics 104, 073509–1–7 (2008).
4. Chung, S.-W., Yu, J.-Y. & Heath, J. R. Silicon nanowire devices. Applied Physics Letters 76, 2068–2070 (2000).
5. Lin, Y.-M., Cronin, S. B., Ying, J. Y., Dresselhaus, M. S. & Heremans, J. P. Transport properties of bi nanowire arrays. Applied Physics Letters 76, 3944–3946 (2000).
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