Early detection of diabetic retinopathy based on deep learning and ultra-wide-field fundus images

Author:

Oh Kangrok,Kang Hae Min,Leem Dawoon,Lee Hyungyu,Seo Kyoung Yul,Yoon Sangchul

Abstract

AbstractVisually impaired and blind people due to diabetic retinopathy were 2.6 million in 2015 and estimated to be 3.2 million in 2020 globally. Though the incidence of diabetic retinopathy is expected to decrease for high-income countries, detection and treatment of it in the early stages are crucial for low-income and middle-income countries. Due to the recent advancement of deep learning technologies, researchers showed that automated screening and grading of diabetic retinopathy are efficient in saving time and workforce. However, most automatic systems utilize conventional fundus photography, despite ultra-wide-field fundus photography provides up to 82% of the retinal surface. In this study, we present a diabetic retinopathy detection system based on ultra-wide-field fundus photography and deep learning. In experiments, we show that the use of early treatment diabetic retinopathy study 7-standard field image extracted from ultra-wide-field fundus photography outperforms that of the optic disc and macula centered image in a statistical sense.

Funder

National Research Foundation of Korea

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

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2. Retinal Disease Diagnosis Using Deep Learning on Ultra-Wide-Field Fundus Images;Diagnostics;2024-01-03

3. Supervised Domain Adaptation for Recognizing Retinal Diseases from Wide-Field Fundus Images;2023 IEEE International Conference on Bioinformatics and Biomedicine (BIBM);2023-12-05

4. AI Based Automated Detection & Classification of Diabetic Retinopathy;2023 7th International Conference on Computation System and Information Technology for Sustainable Solutions (CSITSS);2023-11-02

5. Diabetic Retinopathy Image Classification Using Machine Learning and Local Binary Patterns Features;2023 8th International Symposium on Electrical and Electronics Engineering (ISEEE);2023-10-26

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