Dependence of the damage in optical metal/dielectric coatings on the energy of ions in irradiation experiments for space qualification

Author:

Pelizzo Maria G.,Corso Alain J.,Santi Giovanni,Hübner René,Garoli Denis,Doyle Dominic,Lubin Philip,Cohen Alexander N.,Erlikhman Jacob,Favaro Giulio,Bazzan Marco,Drobny Jon,Curreli Davide,Umansky Maxim

Abstract

AbstractTerrestrial accelerator facilities can generate ion beams which enable the testing of the resistance of materials and thin film coatings to be used in the space environment. In this work, a $$\hbox {TiO}_2$$ TiO 2 /Al bi-layer coating has been irradiated with a $$\hbox {He}^+$$ He + beam at three different energies. The same flux and dose have been used in order to investigate the damage dependence on the energy. The energies were selected to be in the range 4–100 keV, in order to consider those associated to the quiet solar wind and to the particles present in the near-Earth space environment. The optical, morphological and structural modifications have been investigated by using various techniques. Surprisingly, the most damaged sample is the one irradiated at the intermediate energy, which, on the other hand, corresponds to the case in which the interface between the two layers is more stressed. Results demonstrate that ion energies for irradiation tests must be carefully selected to properly qualify space components.

Funder

European Space Agency

Agenzia Spaziale Italiana

National Aeronautics and Space Administration

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3