Resolution enhancement in scanning electron microscopy using deep learning
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-019-48444-2.pdf
Reference27 articles.
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3. Schatten, H. Low voltage high-resolution SEM (LVHRSEM) for biological structural and molecular analysis. Micron 42, 175–185 (2011).
4. Pelton, W. R. Distinguishing the Cause of Textile Fiber Damage Using the Scanning Electron Microscope (SEM). Journal of Forensic Sciences 40, 874–882 (1995).
5. Wu, H. & Melkote, S. N. Study of Ductile-to-Brittle Transition in Single Grit Diamond Scribing of Silicon: Application to Wire Sawing of Silicon Wafers. J. Eng. Mater. Technol 134, 041011 (2012).
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