Thermal hysteresis measurement of the VO2 emissivity and its application in thermal rectification-Reference-Cited by-同舟云学术

Thermal hysteresis measurement of the VO2 emissivity and its application in thermal rectification

Published:2018-05-31 Issue:1 Volume:8 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Gomez-Heredia C. L.,Ramirez-Rincon J. A.,Ordonez-Miranda J.^ORCID,Ares O.,Alvarado-Gil J. J.,Champeaux C.,Dumas-Bouchiat F.,Ezzahri Y.^ORCID,Joulain K.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41598-018-26687-9.pdf

Reference64 articles.

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3. Li, B. et al. Thermal diode: Rectification of heat flux. Phys. Rev. Lett. 93, 184301 (2004).

4. Terraneo, M. et al. Controlling the energy flow in nonlinear lattices: a model for a thermal rectifier. Phys. Rev. Lett. 88, 094302 (2002).

5. Hu, J. et al. Thermal conductivity and thermal rectification in graphene nanoribbons: a molecular dynamics study. Nano Lett. 9, 2730–2735 (2009).

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