On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-018-33309-x.pdf
Reference32 articles.
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3. Park, J.-Y. et al. Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs. IEEE Electron Device Lett. 37, 843–846, https://doi.org/10.1109/LED.2016.2574341 (2016).
4. Huh, Y., Yang, D., Shin, H. & Sung, Y. Hot-Carrier-induced Circuit Degradation in Actual DRAM. IEEE Int. Rel. Phys. Symp. 72–75, https://doi.org/10.1109/RELPHY.1995.513657 (1995).
5. Park, J.-Y. et al. Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection. IEEE Trans. Electron Devices 63, 910–915, https://doi.org/10.1109/TED.2015.2513744 (2016).
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