Crystal Photography with Divergent X-Rays

Author:

LONSDALE K.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Reference4 articles.

1. Kossel, Gött. Nachr. Math. Naturw. Kl., 1, 229 (1935); Ann. Phys., 25, 512; 26, 533 (1936); Ergeb. exakt. Naturw., 16, 295 (1937); Borrmann, Ann. Phys., 27, 669; Voges, ibid., 694 (1936); Cauchois and Hulubei, Comptes rend., 206, 181 (1938); etc.

2. Kikuchi, Proc. Imp. Acad. Tokyo, 4, 354 (1928); Jap. J. Phys., 5, 83 (1928); Thomson and Cochrane, "Theory and Practice of Electron Diffraction" (Macmillan, London, 1939), 111 et seq.

3. Fujiwara and Onoyama, H ros ma J. Sci., 9, 115 (1939); Onoyama, ibid., 125; Fujiwara, ibid., 233.

4. Linnik, NATURE, 124, 946 (1929).

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1. Crystallography;AIP Physics Desk Reference;2003

2. Characterization of (111) Gaas and (111) InP substrates and homoepitaxial layers by divergent x-ray beam diffraction;Journal of Electronic Materials;1977-07

3. Characterization of GaAs substrates and epitaxial GaAs1−xPx layers by divergent x-ray beam diffraction;Journal of Electronic Materials;1975-02

4. Compositional Inhomogeneities in GaAs1−xPx Alloy Epitaxial Layers;Journal of Applied Physics;1968-12

5. CXXIII. Some properties of lines on divergent-beam x-ray photographs;The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science;1952-12

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