Automated defect analysis in electron microscopic images
Author:
Publisher
Springer Science and Business Media LLC
Subject
Computer Science Applications,Mechanics of Materials,General Materials Science,Modeling and Simulation
Link
http://www.nature.com/articles/s41524-018-0093-8.pdf
Reference50 articles.
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5. Zhao, J., Kong, Q.-J., Zhao, X., Liu, J. & Liu, Y. A method for detection and classification of glass defects in low resolution images. In 2011 Sixth International Conference on Image and Graphics (ICIG). 642–647 (IEEE Computer Society Washington, DC, USA 2011).
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