Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Biomedical Engineering,Atomic and Molecular Physics, and Optics,Bioengineering
Reference43 articles.
1. Klitzing, K., Dorda, G. & Pepper, M. New method for high-accuracy determination of the fine-structure constant based on quantized Hall resistance. Phys. Rev. Lett. 45, 494–497 (1980).
2. Mills, I. M., Mohr, P. J., Quinn, T. J., Taylor, B. N. & Williams, E. R. Adapting the International System of Units to the twenty-first century. Phil. Trans. R. Soc. A 369, 3907–3924 (2011).
3. Milton, M. J. T., Davis, R. & Fletcher, N. Towards a new SI: a review of progress made since 2011. Metrologia 51, R21–R30 (2014).
4. Kibble, B. P. in Atomic Masses and Fundamental Constants Vol. 5 (eds Sanders, J. H. & Wapstra, A. H.) 545–551 (New York, 1976).
5. JCGM 200:2012 (E/F) International vocabulary of metrology—Basic and general concepts and associated terms (VIM), 3rd edn (JCGM, 2012).
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