Author:
Nayak Maheswar,Pradhan P. C.,Lodha G. S.,Sokolov A.,Schäfers F.
Abstract
Abstract
We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-destructive and quantitative manner. We demonstrate that the method is sensitive enough to resolve compositional differences of few atomic percent in nano-scaled layered structures of elements with poor electron density differences (0.05%). The present study near the edge of potential impurities in soft x-ray range for low-Z system will stimulate the activity in that field.
Publisher
Springer Science and Business Media LLC
Reference41 articles.
1. Chang, L. L. & Giessen, B. C. (Eds.) Synthetic Modulated Structure (Academic Press, London, UK, 1985).
2. Decher, G. & Schlenoff, J. B. (Eds.) Multilayer Thin Films (WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2003).
3. Spiller, E. Soft X-ray Optics (SPIE Optical Engineering Press, Washington, DC, USA, 1994).
4. Parkin, S. S. P., Chappert, C. & Herman, F. Oscillatory exchange coupling and giant magnetoresistance via Cu-X alloys (X = Au, Fe, Ni). Europhys. Lett. 24, 71–76 (1993).
5. Davies, A., Stroscio, A. J., Pierce, D. T. & Celotta, R. J. Atomic-scale observations of alloying at the Cr-Fe(001) interface. Phys. Rev. Lett. 76, 4175–4178 (1996).
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献