Author:
Cock J. Mark,Sterck Lieven,Rouzé Pierre,Scornet Delphine,Allen Andrew E.,Amoutzias Grigoris,Anthouard Veronique,Artiguenave François,Aury Jean-Marc,Badger Jonathan H.,Beszteri Bank,Billiau Kenny,Bonnet Eric,Bothwell John H.,Bowler Chris,Boyen Catherine,Brownlee Colin,Carrano Carl J.,Charrier Bénédicte,Cho Ga Youn,Coelho Susana M.,Collén Jonas,Corre Erwan,Da Silva Corinne,Delage Ludovic,Delaroque Nicolas,Dittami Simon M.,Doulbeau Sylvie,Elias Marek,Farnham Garry,Gachon Claire M. M.,Gschloessl Bernhard,Heesch Svenja,Jabbari Kamel,Jubin Claire,Kawai Hiroshi,Kimura Kei,Kloareg Bernard,Küpper Frithjof C.,Lang Daniel,Le Bail Aude,Leblanc Catherine,Lerouge Patrice,Lohr Martin,Lopez Pascal J.,Martens Cindy,Maumus Florian,Michel Gurvan,Miranda-Saavedra Diego,Morales Julia,Moreau Hervé,Motomura Taizo,Nagasato Chikako,Napoli Carolyn A.,Nelson David R.,Nyvall-Collén Pi,Peters Akira F.,Pommier Cyril,Potin Philippe,Poulain Julie,Quesneville Hadi,Read Betsy,Rensing Stefan A.,Ritter Andrés,Rousvoal Sylvie,Samanta Manoj,Samson Gaelle,Schroeder Declan C.,Ségurens Béatrice,Strittmatter Martina,Tonon Thierry,Tregear James W.,Valentin Klaus,von Dassow Peter,Yamagishi Takahiro,Van de Peer Yves,Wincker Patrick
Publisher
Springer Science and Business Media LLC