Author:
Nierman William C.,Pain Arnab,Anderson Michael J.,Wortman Jennifer R.,Kim H. Stanley,Arroyo Javier,Berriman Matthew,Abe Keietsu,Archer David B.,Bermejo Clara,Bennett Joan,Bowyer Paul,Chen Dan,Collins Matthew,Coulsen Richard,Davies Robert,Dyer Paul S.,Farman Mark,Fedorova Nadia,Fedorova Natalie,Feldblyum Tamara V.,Fischer Reinhard,Fosker Nigel,Fraser Audrey,García Jose L.,García Maria J.,Goble Arlette,Goldman Gustavo H.,Gomi Katsuya,Griffith-Jones Sam,Gwilliam Ryan,Haas Brian,Haas Hubertus,Harris David,Horiuchi H.,Huang Jiaqi,Humphray Sean,Jiménez Javier,Keller Nancy,Khouri Hoda,Kitamoto Katsuhiko,Kobayashi Tetsuo,Konzack Sven,Kulkarni Resham,Kumagai Toshitaka,Lafton Anne,Latgé Jean-Paul,Li Weixi,Lord Angela,Lu Charles,Majoros William H.,May Gregory S.,Miller Bruce L.,Mohamoud Yasmin,Molina Maria,Monod Michel,Mouyna Isabelle,Mulligan Stephanie,Murphy Lee,O'Neil Susan,Paulsen Ian,Peñalva Miguel A.,Pertea Mihaela,Price Claire,Pritchard Bethan L.,Quail Michael A.,Rabbinowitsch Ester,Rawlins Neil,Rajandream Marie-Adele,Reichard Utz,Renauld Hubert,Robson Geoffrey D.,de Córdoba Santiago Rodriguez,Rodríguez-Peña Jose M.,Ronning Catherine M.,Rutter Simon,Salzberg Steven L.,Sanchez Miguel,Sánchez-Ferrero Juan C.,Saunders David,Seeger Kathy,Squares Rob,Squares Steven,Takeuchi Michio,Tekaia Fredj,Turner Geoffrey,de Aldana Carlos R. Vazquez,Weidman Janice,White Owen,Woodward John,Yu Jae-Hyuk,Fraser Claire,Galagan James E.,Asai Kiyoshi,Machida Masayuki,Hall Neil,Barrell Bart,Denning David W.
Publisher
Springer Science and Business Media LLC