Hole trap formation in polymer light-emitting diodes under current stress
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry
Link
http://www.nature.com/articles/s41563-018-0057-x.pdf
Reference19 articles.
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2. Parker, I. D., Cao, Y. & Yang, C. Y. Lifetime and degradation effects in polymer light-emitting diodes. J. Appl. Phys. 85, 2441–2447 (1999).
3. Silvestre, G. C. M., Johnson, M. T., Giraldo, A. & Shannon, J. M. Light degradation and voltage drift in polymer light-emitting diodes. Appl. Phys. Lett. 78, 1619–1621 (2001).
4. Stegmaier, K. et al. Influence of electrical fatique on hole transport in poly(p-phenylenevinylene)-based organic light-emitting diodes. J. Appl. Phys. 110, 034507 (2011).
5. Gassmann, A. et al. Study of electrical fatigue by defect engineering in organic light-emitting diodes. Mater. Sci. Eng. B 192, 26–51 (2015).
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