Author:
Aversa Rossella,Modarres Mohammad Hadi,Cozzini Stefano,Ciancio Regina,Chiusole Alberto
Publisher
Springer Science and Business Media LLC
Subject
Library and Information Sciences,Statistics, Probability and Uncertainty,Computer Science Applications,Education,Information Systems,Statistics and Probability
Reference10 articles.
1. Aversa, R., Cozzini, S. & Jejkal, T. First testbed available. Deliverable No. 8.4
http://www.nffa.eu/media/180983/nffaeu-d8_4.pdf
(NFFA-EUROPE (2017).
2. Modarres, M. H. et al. Neural Network for Nanoscience Scanning Electron Microscope Image Recognition. Scientific Reports 7, 13282 (2017).
3. Chowdhury, A., Kautz, E., Yener, B. & Lewis, D. Image driven machine learning methods for microstructure recognition. Computational Materials Science 123, 176–187 (2016).
4. Al-Khedher, M. A., Pezeshki, C., McHale, J. L. & Knorr, F. J. Quality classification via Raman identification and SEM analysis of carbon nanotube bundles using artificial neural networks. Nanotechnology 18, 355–703 (2007).
5. Deng, J. et al. ImageNet: A Large-Scale Hierarchical Image Database, CVPR09
http://www.image-net.org/papers/imagenet_cvpr09.bib
(2009).
Cited by
57 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献