Author:
Zheng Yan-Zong,Soo Yun-Liang,Chang Shih-Lin
Publisher
Springer Science and Business Media LLC
Reference30 articles.
1. Jen, C.-Y. & Chang, S.-L. Bragg-surface three-beam dynamical X-ray diffraction. Acta Cryst. A 48, 655–663 (1992).
2. Hayashi, M. A. et al. Sensitivity of Bragg-surface diffraction to analyze ion-implanted semiconductors. Appl. Phys. Lett. 71, 2614–2616 (1997).
3. Chang, S.-L. X-ray multiple-wave diffraction (Springer-Verlag, 2004).
4. Bussone, G. et al. Investigation of surface and sub-surface damage in high quality synthetic diamonds by X-ray reflectivity and grazing incidence in-plane diffraction. Phys. Status Solidi A 208, No. 11, 2612–2618 (2011).
5. Haubold, S. et al. Intensity distribution of the eight-beam case of the Si-888 reflection in backscattering geometry. Z. Kristallogr. 219, 81–87 (2004).
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献