Discrimination of green model paints by elemental analysis using SEM/EDX
Author:
Affiliation:
1. Criminal Investigation Laboratory of Nara Prefectural Police H.Q.
2. Formerly with Criminal Investigation Laboratory of Nara Prefectural Police H.Q.
3. Japan Synchrotron Radiation Research Institute
Publisher
Japanese Association of Forensic Science and Technology
Subject
General Medicine
Link
https://www.jstage.jst.go.jp/article/jafst/25/1/25_757/_pdf
Reference7 articles.
1. 2) Haag L. C., Element profiles of automotive paint chips by X-ray fluorescence spectrometry. J. Forensic Sci., 16, 255-263, 1976.
2. 3) Howden C. R., Dudley R. J. and Smalldon K. W., The non-destructive analysis of single layered household paints using energy dispersive X-ray fluorescence spectrometry. J. Forensic Sci., 17, 161-167, 1977.
3. 4) Beam T. W. and Willis W. V., Analysis protocol for discrimination of automotive paints by SEM-EDXA using beam alignments by current centering. J. Forensic Sci., 35, 1055-1063, 1990.
4. 5) Lee Y., Han S., Yoon J. H., Kim Y. M., Shon S. K. and Park S. W., Application of time-of-flight secondary ion mass spectrometry to automobile paint analysis. Anal. Sci., 17, 757-761, 2001.
5. 6) Hobbs A. L. and Almirall J. R., Trace elemental analysis of automotive paints by laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS). Anal. Bioanal. Chem., 376, 1265-1271, 2003.
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