Atomic force microscopy of histological sections using a new electron beam etching method-Reference-Cited by-同舟云学术

Atomic force microscopy of histological sections using a new electron beam etching method

Published:1998-01 Issue:1 Volume:189 Page:43-49
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Osada ¹,Arakawa ¹,Ichikawa ²,Ikai ¹

Affiliation:

1. Department of Biological Sciences, Faculty of Bioscience and Biotechnology, Tokyo Institute of Technology, 4259 Nagatsuta, Midori‐ku, Yokohama 227, Japan,

2. Anatomy and Embryology, Tokyo Metropolitan Institute for Neuroscience, Fuchu, Tokyo 183, Japan

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1046/j.1365-2818.1998.00269.x

Reference26 articles.

1. Imaging of the surface structures of Epon thin sections created with a glass knife and a diamond knife by the atomic force microscope;Amako K.;J. Electron Microsc,1993

2. Surface Studies by Scanning Tunneling Microscopy

3. Atomic Force Microscope

4. Circular DNA molecules imaged in air by scanning force microscopy

5. Specific antigen/antibody interactions measured by force microscopy

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