Time–frequency analysis: a tool to discriminate artefacts from near‐field optical data
Author:
Affiliation:
1. Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP 2060, F‐10010 Troyes cedex, France
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1046/j.1365-2818.2001.00803.x
Reference18 articles.
1. A 3-D multilayer model of scattering by nanostructures. Application to the optimisation of thin coated nano-sources
2. Application of Fourier algorithm to Near Field Optical Images: Local Resolution Estimation
3. Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations
4. Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: characterization with a spline and Fourier spectrum
5. Wavelet analysis of near-field data and the resolution problem
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Scanning near-field optical microscopy signal processing and resolution;Applied Optics;2007-04-03
2. Use of a resonant optical cavity to increase the spectral density of near-field optical images;Optics Communications;2001-10
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