In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al-Reference-Cited by-同舟云学术

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In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al

Published:2001-07 Issue:1 Volume:203 Page:17-21
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:J Microsc

Author:

Tsukimoto S.,Arai S.,Konno M.,Kamino T.,Sasaki K.,Saka H.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1046/j.1365-2818.2001.00905.x/fullpdf

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural ordering at solid-liquid interfaces in Al-Sm system: A molecular-dynamics study;Materials Letters;2017-01

2. In-situ Transmission Electron Microscopy;In-situ Materials Characterization;2014

3. Atomistic characterization of the chemically heterogeneous Al–Pb solid–liquid interface;Acta Materialia;2012-07

4. Are electron tweezers possible?;Ultramicroscopy;2011-11

5. Temperature dependence of the plasmon energy in liquid and solid phases of pure Al and of an Al-Si alloy using electron energy-loss spectroscopy;Journal of Applied Physics;2011-08-15

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