Characterization of nitride thin films by electron backscatter diffraction-Reference-Cited by-同舟云学术

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Characterization of nitride thin films by electron backscatter diffraction

Published:2002-03 Issue:3 Volume:205 Page:226-230
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:J Microsc

Author:

Trager-Cowan C.,Sweeney F.,Hastie J.,Manson-Smith S. K.,Cowan D. A.,McColl D.,Mohammed A.,O'Donnell K. P.,Zubia D.,Hersee S. D.,Foxon C. T.,Harrison I.,Novikov S. V.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1046/j.1365-2818.2002.00996.x/fullpdf

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Combinatorial substrate epitaxy: a new approach to growth of complex metastable compounds;CrystEngComm;2013

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4. Titanium oral implants: surface characteristics, interface biology and clinical outcome;Journal of The Royal Society Interface;2010-06-30

5. Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films;Physical Review B;2007-02-01

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