Energy-filtered transmission electron microscopy of multilayers in semiconductors
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1046/j.1365-2818.1999.00459.x/fullpdf
Reference14 articles.
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3. Egerton , R.F. 1997 Electron Energy-Loss Spectroscopy in the Electron Microscope
4. The effect of lens aberrations on the spatial resolution of an energy-filtered TEM image;Egerton;Micron,1997
5. EELS of ‘thick’ specimens;Egerton;Ultramicroscopy,1991
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