Reflection mode scanning near-field optical microscopy analyses of integrated devices-Reference-Cited by-同舟云学术

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Reflection mode scanning near-field optical microscopy analyses of integrated devices

Published:1999-05 Issue:2-3 Volume:194 Page:542-544
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:J Microsc

Author:

Cramer ,Chin ,Balk

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1046/j.1365-2818.1999.00511.x/fullpdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning near-field photon emission microscopy;2008 IEEE International Reliability Physics Symposium;2008-04

2. High resolution index of refraction profiling of optical waveguides;SPIE Proceedings;2003-02-01

3. Observation of the in - vivo Reporter of Green Fluorescent Protein in a Plant Root by Scanning Near-Field Optical Microscopy;Chinese Physics Letters;2002-08-22

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