Are Crystal Polymorphs Predictable? The Case of Sexithiophene-Reference-Cited by-同舟云学术

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Are Crystal Polymorphs Predictable? The Case of Sexithiophene

Published:2008-07-01 Issue:29 Volume:112 Page:6715-6722
ISSN:1089-5639
Container-title:The Journal of Physical Chemistry A
language:en
Short-container-title:J. Phys. Chem. A

Author:

Della Valle Raffaele Guido¹,Venuti Elisabetta¹,Brillante Aldo¹,Girlando Alberto²

Affiliation:

1. Dipartimento di Chimica Fisica e Inorganica and INSTM-UdR Bologna, Universita di Bologna, Viale Risorgimento 4, I-40136 Bologna, Italy

2. Dipartimento di Chimica GIAF and INSTM-UdR Parma, Universita di Parma, Parco Area delle Scienze, I-43100 Parma, Italy

Publisher

American Chemical Society (ACS)

Subject

Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp801749n

Reference71 articles.

1. Organic single-crystal field-effect transistors

2. Interface engineering in organic transistors

3. Crystal Growth, Structure, and Electronic Band Structure of α-4T Polymorphs

4. Polymorphism in Oligothiophenes with an Even Number of Thiophene Subunits

5. A New Polymorphic Modification of Tetrathiafulvalene. Crystal Structure, Lattice Energy and Intermolecular Interactions

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystal‐structure simulation of methylthiolated peri‐condensed polycyclic aromatic hydrocarbons for identifying promising molecular semiconductors: discovery of 1,3,8,10‐tetrakis(methylthio)peropyrene showing ultrahigh mobility;Advanced Materials;2023-07-19

2. Charge mobility calculation of organic semiconductors without use of experimental single-crystal data;Scientific Reports;2020-02-17

3. Temperature controlled interlayer disorder in ultrathin films of α-sexithiophene;Thin Solid Films;2017-11

4. Report on the sixth blind test of organic crystal structure prediction methods;Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials;2016-08-01

5. Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films;Journal of Synchrotron Radiation;2016-04-20

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