Structural and Electrical Characterization of Processable Bis-Silylated Thiophene Oligomers-Reference-Cited by-同舟云学术

Structural and Electrical Characterization of Processable Bis-Silylated Thiophene Oligomers

Published:1998-10-28 Issue:11 Volume:10 Page:3683-3689
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Barbarella G.¹,Ostoja P.¹,Maccagnani P.¹,Pudova Olga¹,Antolini L.¹,Casarini D.¹,Bongini A.¹

Affiliation:

1. I.Co.C.E.A., L.A.M.E.L., Consiglio Nazionale Ricerche, Via Gobetti 101, 40129 Bologna, Italy, Latvian Institute of Organic Synthesis, Aizkraukles str. 21, Riga, LV-1006, Latvia, Dipartimento di Chimica, Universitá di Modena, Via Campi 183, 41100 Modena, Italy, Dipartimento di Chimica Organica, Universitá di Bologna, Via Risorgimento 4, 40110 Bologna, Italy, and Dipartimento di Chimica “G. Ciamician”, Universitá di Bologna, Via Selmi 2, 40126 Bologna, Italy

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm9804261

Reference41 articles.

1. Molecular engineering of organic semiconductors: design of self-assembly properties in conjugated thiophene oligomers

2. Polymorphism and Charge Transport in Vacuum-Evaporated Sexithiophene Films

3. Thin film transistors based on molecular semiconductors

4. Thin-film transistors based on organic conjugated semiconductors

5. A Highly π-Stacked Organic Semiconductor for Thin Film Transistors Based on Fused Thiophenes

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