Imaging the Evolution of d States at a Strontium Titanate Surface-Reference-Cited by-同舟云学术

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Imaging the Evolution of d States at a Strontium Titanate Surface

Published:2014-11-27 Issue:49 Volume:136 Page:17201-17206
ISSN:0002-7863
Container-title:Journal of the American Chemical Society
language:en
Short-container-title:J. Am. Chem. Soc.

Author:

Hamada Ikutaro¹,Shimizu Ryota¹,Ohsawa Takeo¹,Iwaya Katsuya¹²,Hashizume Tomihiro¹³⁴,Tsukada Masaru¹,Akagi Kazuto¹,Hitosugi Taro¹⁵

Affiliation:

1. Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai 980-8577, Japan

2. RIKEN Center for Emergent Matter Science, Wako 351-0198, Japan

3. Central Research Laboratory, Hitachi, Ltd., Saitama 350-0395, Japan

4. Department of Physics, Tokyo Institute of Technology, Tokyo 152-8551, Japan

5. PRESTO, Japan Science and Technology Agency, Tokyo 102-0076, Japan

Funder

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

Colloid and Surface Chemistry,Biochemistry,General Chemistry,Catalysis

Link

https://pubs.acs.org/doi/pdf/10.1021/ja509231w

Reference47 articles.

1. Filling dependence of electronic properties on the verge of metal–Mott-insulator transition inSr1−xLaxTiO3

2. Superconductivity in Semiconducting SrTiO3

3. SrTiO3: An intrinsic quantum paraelectric below 4 K

4. A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface

5. Tunable Quasi-Two-Dimensional Electron Gases in Oxide Heterostructures

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2. Atomic-Site-Dependent Pairing Gap in Monolayer FeSe/SrTiO₃(001)–(√13 × √13);Nano Letters;2024-06-25

3. Scanning tunneling microscopy observation of Fe deposited SrTiO<sub>3</sub>(100)-(√13 × √13)-R33.7° surface;Journal of the Ceramic Society of Japan;2023-10-01

4. Identification of OH groups on SrTiO3(100)-(13×13)-R33.7° reconstructed surface by non-contact atomic force microscopy and scanning tunneling microscopy;Applied Physics Letters;2023-02-13

5. Atomic-scale growth, imaging, spectroscopy, and electronic transport properties of metal-oxide films and interfaces;Journal of Vacuum Science & Technology A;2022-01

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