Van der Waals Interaction Energies of Helium, Neon, and Argon with Naphthalene
Author:
Affiliation:
1. Universität Bonn, Institut für Physikalische und Theoretische Chemie, Wegelerstrasse 12, 53115 Bonn, Germany
2. Universita' degli Studi dell' Insubria, Dipartimento di Scienze CC.FF.MM., Via Lucini 3, I-22100 Como, Italy
Publisher
American Chemical Society (ACS)
Subject
Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp011509z
Reference28 articles.
1. Intermolecular dynamics of benzene–rare gas complexes as derived from microwave spectra
2. Ground state benzene–argon intermolecular potential energy surface
3. Ab initio second‐ and fourth‐order Mo/ller–Plesset study on structure, stabilization energy, and stretching vibration of benzene⋅⋅⋅X (X=He,Ne,Ar,Kr,Xe) van der Waals molecules
4. The infrared spectrum of the benzene–Ar cation
5. Sub-Doppler UV spectroscopy by resonance-enhanced two-photon ionization: the structure of the benzene20,22Ne cluster
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