First-Principles Structural and Electronic Characterization of Ordered SiO2 Nanowires-Reference-Cited by-同舟云学术

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First-Principles Structural and Electronic Characterization of Ordered SiO2 Nanowires

Published:2012-08-24 Issue:35 Volume:116 Page:18973-18982
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Martínez José I.¹,Calle-Vallejo Federico²,Krowne Clifford M.³,Alonso Julio A.⁴

Affiliation:

1. Departamento de Física Teórica de la Materia Condensada, Universidad Autónoma de Madrid, E-28049 Madrid, Spain

2. Leiden Institute of Chemistry, Leiden University, PO Box 9502, 2300 RA Leiden, The Netherlands

3. Microwave Technology Branch, Electronics Science & Technology Division, Naval Research Laboratory, Washington, D.C. 20375, United States

4. Departamento de Física Teórica, Atómica y Óptica, Facultad de Ciencias, Universidad de Valladolid, ES-47005 Valladolid, Spain

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp3009223

Reference49 articles.

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