Nanogap-Rich Surface-Enhanced Raman Spectroscopy-Active Substrate Based on Double-Step Deposition and Annealing of the Au Film over the Back Side of Polished Si-Reference-Cited by-同舟云学术

Nanogap-Rich Surface-Enhanced Raman Spectroscopy-Active Substrate Based on Double-Step Deposition and Annealing of the Au Film over the Back Side of Polished Si

Published:2023-02-09 Issue:7 Volume:15 Page:10250-10260
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Awasthi Vimarsh¹^ORCID,Malik Pariksha²^ORCID,Goel Richa¹,Srivastava Pankaj²,Dubey Satish Kumar¹^ORCID

Affiliation:

1. SeNSE Centre, Indian Institute of Technology Delhi, Delhi 110016, India

2. Nanostech Laboratory, Department of Physics, Indian Institute of Technology Delhi, Delhi 110016, India

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.2c21378

Reference49 articles.

1. A Rapid and Sensitive Quantitative Analysis Method for TNT using Raman Spectroscopy

2. Single molecule analysis by surfaced-enhanced Raman scattering

3. Optical nanoantenna for beamed and surface‐enhanced Raman spectroscopy

4. Silver particles on stochastic quartz substrates providing tenfold increase in Raman enhancement

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