Evaluating the Optical Response of Heavily Decorated Black Silicon Based on a Realistic 3D Modeling Methodology

Author:

Li Yuhang1,Wang Dong2ORCID,Liang Zhengchen13,Zeng Lingxiao1,Li Wenxue1,Xie Peng1,Ding Qi1,Zhang Hong14,Schaaf Peter2ORCID,Wang Wei1ORCID

Affiliation:

1. College of Physics, Sichuan University, Chengdu 610064, China

2. Institute for Micro and Nanotechnologies MacroNano(R) and Institute for Materials Science and Engineering, Chair of Materials for Electrical Engineering and Electronics, Technische Universität Ilmenau, 98693 Ilmenau, Germany

3. Department of Physics, Tsinghua University, Beijing 100084, P. R. China

4. Key Laboratory of High Energy Density Physics and Technology of Ministry of Education, Sichuan University, Chengdu 610065, China

Funder

Technische Universit?t Ilmenau

Sichuan University

Ministry of Science and Technology of the People's Republic of China

Deutsche Forschungsgemeinschaft

National Natural Science Foundation of China

Innovation Program of Sichuan University

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

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