X-ray Photoelectron Spectroscopy: A Unique Tool To Determine the Internal Heterostructure of Nanoparticles-Reference-Cited by-同舟云学术

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X-ray Photoelectron Spectroscopy: A Unique Tool To Determine the Internal Heterostructure of Nanoparticles

Published:2013-03-04 Issue:8 Volume:25 Page:1222-1232
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Sarma D. D.¹²,Santra Pralay K.¹³,Mukherjee Sumanta¹,Nag Angshuman¹

Affiliation:

1. Solid State and Structural Chemistry Unit, Indian Institute of Science, Bangalore 560012, India

2. Council of Scientific and Industrial Research—Network of Institutes for Solar Energy (CSIR-NISE), New Delhi, India

3. Radiation Laboratory, Departments of Chemistry & Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, United States

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm303567d

Reference70 articles.

1. A simple model for the ionization potential, electron affinity, and aqueous redox potentials of small semiconductor crystallites

2. Nanometer-sized semiconductor clusters: materials synthesis, quantum size effects, and photophysical properties

3. Evolution of the electronic structure with size in II-VI semiconductor nanocrystals

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