X-Ray Spectrographic Determination of Zirconium, Tungsten, Vanadium, Iron, Titanium, Tantalum, and Niobium Oxides. Application of the Correction Factor Method
Author:
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac60168a029
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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2. Unification of fundamental matrix correction methods in X-ray fluorescence analysis. Arguments for a new binary coefficient approach;X-Ray Spectrometry;1988-06
3. Wavelength-dispersive X-ray fluorescence spectrometric technique for determining major and minor elements in columbite-tantalite using a rhodium excitation source;X-Ray Spectrometry;1986-04
4. Quantitative determination of tantalum in niobium by neutron activation analysis;Canadian Journal of Chemistry;1980-03-01
5. Quantitative Analysis;Introduction to X-Ray Spectrometric Analysis;1978
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