Smart Scattering Scanning Near-Field Optical Microscopy-Reference-Cited by-同舟云学术

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Smart Scattering Scanning Near-Field Optical Microscopy

Published:2020-11-12 Issue:12 Volume:7 Page:3346-3352
ISSN:2330-4022
Container-title:ACS Photonics
language:en
Short-container-title:ACS Photonics

Author:

Labouesse Simon¹,Johnson Samuel C.²^ORCID,Bechtel Hans A.³,Raschke Markus B.²^ORCID,Piestun Rafael¹^ORCID

Affiliation:

1. Department of Electrical, Computer, and Energy Engineering, University of Colorado, Boulder, Colorado 80309, United States

2. Department of Physics, Department of Chemistry, and JILA, University of Colorado, Boulder, Colorado 80309, United States

3. Advanced Light Source Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

Funder

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Biotechnology,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.0c00553

Reference32 articles.

1. Nano-Chemical Infrared Imaging of Membrane Proteins in Lipid Bilayers

2. Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution

3. Near-field scanning optical microscope with a metallic probe tip

4. Near-field optical microscope based on local perturbation of a diffraction spot

5. Near-field microscopy by elastic light scattering from a tip

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1. Accelerated Nano-Optical Imaging through Sparse Sampling;Nano Letters;2024-02-08

2. Pseudoheterodyne interferometry for multicolor near-field imaging;Optics Express;2023-06-20

3. Undersampling raster scans in spectromicroscopy for a reduced dose and faster measurements;Optics Express;2022-11-09

4. Assessment of Subsampling Schemes for Compressive Nano-FTIR Imaging;IEEE Transactions on Instrumentation and Measurement;2022

5. Efficient Adaptive Surface Measurement Based on Multilevel Gaussian Process Modeling and Scanning Path Optimization;IEEE Transactions on Instrumentation and Measurement;2022

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