Spectroscopic Nanoimaging of All-Semiconductor Plasmonic Gratings Using Photoinduced Force and Scattering Type Nanoscopy-Reference-Cited by-同舟云学术

Spectroscopic Nanoimaging of All-Semiconductor Plasmonic Gratings Using Photoinduced Force and Scattering Type Nanoscopy

Published:2018-10-22 Issue:11 Volume:5 Page:4352-4359
ISSN:2330-4022
Container-title:ACS Photonics
language:en
Short-container-title:ACS Photonics

Author:

Huang Yi¹,Legrand David¹²³,Vincent Rémi¹,Dogbe Foli Ekoué Athos¹,Nowak Derek⁴,Lerondel Gilles¹,Bachelot Renaud¹^ORCID,Taliercio Thierry⁵,Barho Franziska⁵,Cerutti Laurent⁵,Gonzalez-Posada Fernando⁵,Tay Beng Kang²³^ORCID,Bruyant Aurelien¹^ORCID

Affiliation:

1. ICD-L2N, CNRS UMR 6281, Université de Technologie de Troyes, Troyes, France

2. Electrical and Electronic Engineering Department, Nanyang Technological University, Singapore 639798, Singapore

3. CINTRA, CNRS-NTU-Thales, UMI 3288, 50 Nanyang Drive, Singapore 637553, Singapore

4. Molecular Vista, San Jose, California, United States

5. IES, Université de Montpellier, CNRS, Montpellier, France

Funder

Agence Nationale de la Recherche

China Scholarship Council

Publisher

American Chemical Society (ACS)

Subject