Synthetic Dimensions Using Ultrafast Free Electrons
Author:
Affiliation:
1. Department of Physics, Technion, Haifa 3200003, Israel
2. Department of Electrical Engineering Physical Electronics, Tel Aviv University, Ramat Aviv 6997801, Israel
Funder
Israel Science Foundation
National Natural Science Foundation of China
Publisher
American Chemical Society (ACS)
Link
https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.4c00439
Reference65 articles.
1. Photon-induced near-field electron microscopy
2. Photon-induced near-field electron microscopy (PINEM): theoretical and experimental
3. Multiphoton Absorption and Emission by Interaction of Swift Electrons with Evanescent Light Fields
4. Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
5. Ultrafast nanoimaging of the order parameter in a structural phase transition
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