Transient Tap Couplers for Wafer-Level Photonic Testing Based on Optical Phase Change Materials-Reference-Cited by-同舟云学术

Transient Tap Couplers for Wafer-Level Photonic Testing Based on Optical Phase Change Materials

Published:2021-06-15 Issue:7 Volume:8 Page:1903-1908
ISSN:2330-4022
Container-title:ACS Photonics
language:en
Short-container-title:ACS Photonics

Author:

Zhang Yifei¹^ORCID,Zhang Qihang¹,Ríos Carlos¹^ORCID,Shalaginov Mikhail Y.¹^ORCID,Chou Jeffrey B.²,Roberts Christopher²,Miller Paul²,Robinson Paul²,Liberman Vladimir²,Kang Myungkoo³^ORCID,Richardson Kathleen A.³,Gu Tian¹^ORCID,Vitale Steven A.²^ORCID,Hu Juejun¹

Affiliation:

1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

2. Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02421, United States

3. College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816, United States

Funder

Defense Advanced Research Projects Agency

Assistant Secretary of Defense for Research and Engineering

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Biotechnology,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsphotonics.1c00374

Reference43 articles.

1. Photonic switching in high performance datacenters [Invited]

2. An optical-frequency synthesizer using integrated photonics

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5. Quantum transport simulations in a programmable nanophotonic processor

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