Line and Point Defects in MoSe2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy-Reference-Cited by-同舟云学术

Line and Point Defects in MoSe2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy

Published:2015-06-10 Issue:6 Volume:9 Page:6619-6625
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Liu Hongjun¹,Zheng Hao¹²³,Yang Fang²,Jiao Lu¹,Chen Jinglei¹,Ho Wingkin¹,Gao Chunlei²³,Jia Jinfeng²³,Xie Maohai¹

Affiliation:

1. Physics Department, The University of Hong Kong, Pokfulam Road, Hong Kong, China

2. Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiaotong University, 800 Dongchuan Road, Shanghai 200240, China

3. Collaborative Innovation Center of Advanced Microstructures, Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, P. R. China

Funder

Research Grants Council, University Grants Committee, Hong Kong

National Natural Science Foundation of China

Ministry of Education of the People's Republic of China

University of Hong Kong

Ministry of Science and Technology of the People's Republic of China

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.5b02789