Direct Growth of Bi2SeO5 Thin Films for High-k Dielectrics via Atomic Layer Deposition

Author:

Park Hyeonbin12,Hwang Jae Hun13,Oh Seung Hoon1,Ryu Jin Joo13,Jeon Kanghyeok1,Kang Minsoo2ORCID,Chai Hyun-Jun2,Ham Ayoung2,Kim Gun Hwan34ORCID,Kang Kibum25ORCID,Eom Taeyong16ORCID

Affiliation:

1. Thin Film Materials Research Center, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Daejeon, Yuseong-gu 34114, Republic of Korea

2. Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Daejeon, Yuseong-gu 34141, Republic of Korea

3. Department of Materials Science and Engineering, Yonsei University, 50 Yonsei-ro, Seoul, Seodaemun-gu 03722, Republic of Korea

4. Department of System Semiconductor Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea

5. Graduate School of Semiconductor Technology, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Daejeon, Yuseong-gu 34141, Republic of Korea

6. Department of Semiconductor System Engineering, Sejong University, 209 Neungdong-ro, Seoul, Gwangjin-gu 05006, Republic of Korea

Funder

Korea Research Institute of Chemical Technology

National Research Foundation of Korea

Publisher

American Chemical Society (ACS)

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