Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography-Reference-Cited by-同舟云学术

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Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography

Published:2018-08-06 Issue:8 Volume:12 Page:8555-8563
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Braeuninger-Weimer Philipp¹^ORCID,Funke Sebastian²,Wang Ruizhi¹^ORCID,Thiesen Peter²,Tasche Daniel³,Viöl Wolfgang³,Hofmann Stephan¹^ORCID

Affiliation:

1. Department of Engineering, University of Cambridge, Cambridge CB3 0FA, United Kingdom

2. Accurion GmbH, Stresemannstraße 30, Göttingen 37079, Germany

3. Faculty of Natural Sciences and Technology, University of Applied Sciences and Arts, Von-Ossietzky-Straße 99, Göttingen 37085, Germany

Funder

Engineering and Physical Sciences Research Council

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.8b04167

Reference80 articles.

1. Challenges and opportunities in graphene commercialization

2. CVD-Enabled Graphene Manufacture and Technology

3. Science and technology roadmap for graphene, related two-dimensional crystals, and hybrid systems

4. A roadmap for graphene

5. Roll-to-roll production of 30-inch graphene films for transparent electrodes

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